Materials characterization techniques all have their own strengths and weaknesses. A synergetic approach between complementary techniques such as Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT) could magnify the power of these techniques – allowing discoveries that each alone would miss. The standard and cutting-edge technologies of each technique will be summarized from specimen preparation to data reduction and examples of the complimentary techniques will be discussed.
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Presenter:
Rob Ulfig
Senior Applications and Business Developer
CAMECA
Robert Ulfig has been working with Atom Probe Microscopes at CAMECA in Madison since 2001. He currently works to integrate the activities and requests from internal and external customers into the latest and greatest of CAMECA’s software and hardware while developing new applications and markets. Rob graduated from The University of Wisconsin-Madison with Materials Science, Nuclear Engineering and Engineering Physics degrees.