Skip to content


The job board is a place to post an open position, solicit proposals, or to advertise your skills for positions requiring the unique skills of atom probe tomography specialists. CAMECA does not endorse any position or person below and simply provides this information for your convenience. For positions available within AMETEK, please follow this link.

Employment Available Click here to post a job opening.

Searching for Employment Click here to post your availability.


NIMS: National Institute for Materials Science
1-2-1 Sengen, Tsukuba 305-0046, Japan

A post doc position for structural characterizations of semiconductor devices

A candidate must have a Ph.D. in Materials Science or Applied Physics with experimental skills for semiconductor device characterizations. Strong background in semiconductor materials is required. Prior experience on macrostructure characterizations using SEM/FIB, TEM and/or atom probe tomography is
desirable. A successful candidate is expected to work on the characterizations of GaN power devices.

The initial annual salary ranges from 3.8 to 4.5 million Japanese yen depending on experiences and skills. The initial contract term is one year, which is renewable up to 5 years with annual evaluation.

For more information please see our website at

Applicants should send a resume with a list of publications, reprints of three selected papers, brief summary of past research accomplishments (1 page) and contact address of two references with subject: “post doc application on GaN” to

Tadakatsu Ohkubo
Magnetic Materials Analysis Group Leader
Research Center for Magnetic and Spintronic Materials
National Institute for Materials Science

IFM: Institute for Frontier Materials, DEAKIN University

PhD position: Three-dimensional atomic mapping of single bacterial cells

Keywords: Atom probe tomography (APT); Focused Ion Beam Microscopy (FIB); Scanning Electron Microscopy (SEM); Transmission Electron Microscopy (TEM).

Description of project:
The PhD project is funded by an Australian Research Council (ARC) Discovery Project Grant, DP180103955, and is hosted by the Institute for Frontier Materials, Deakin University, in collaboration with colleagues from Monash University (Department of Mechanical and Aerospace Engineering and Faculty of Pharmacy and Pharmaceutical Sciences). The project will be for 3 years duration and is available now.

The aim of the project is to develop novel approaches for atomic-scale analysis of single biological cells. It will combine expertise in nano/micro engineering and cellular imaging (FIB, SEM, TEM), to achieve a reproducible process for manipulating bacterial cells in close-to-native state at 10 to 100 nm scale, followed by quantitative atomic resolution chemical imaging using APT. As such, it will provide insight into the structural and chemical changes in the bacterial cell membrane during drug loading (i.e. the interactions of antibiotics with bacteria), to be compared with results from dehydrated samples [1,2]. This work will establish a new path for understanding the interactions of organelles and proteins in the subcellular domain, and will accelerate research in basic cell biology and drug development.

[1] V.R. Adineh, R.K.W. Marceau, Y. Chen, K.J. Si, T. Velkov, W. Cheng, J. Li, J. Fu, “Pulsed-voltage atom probe
tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale
specimen geometry'”. Ultramicroscopy 181 (2017), pp. 150-159.
[2] V.R. Adineh, R.K.W. Marceau, T. Velkov, J. Li, J. Fu, “Near-Atomic Three-Dimensional Mapping for Site-Specific
Chemistry of 'Superbugs'”. Nano Letters 16 (2016), pp. 7113-7120.

Required skills:
The candidate must have a Masters degree in research and should have a strong background in physics or engineering. The project involves extensive experimental work, the scale and scope of which will require the student to develop an extensive range of expertise on a number of advanced characterisation instruments and techniques. Prior experience in atom probe tomography and/or electron microscopy is desired. The candidate must demonstrate the ability to work in a team, demonstrate initiative and be able to work independently on complex instruments.

Dr Ross Marceau

Applicants are invited to apply for a two-year postdoctoral position, funded by the National Science Foundation (NSF), under the supervision of Dr. Alberto Pérez-Huerta in the Department of Geological Sciences at the University of Alabama. The successful candidate will be involved in the development and optimization of atom probe tomography (APT) for applications in Earth Sciences, in collaboration with the UA Central Analytical Facilities (CAF; Minimum qualifications: 1) Ph.D. in Geosciences, Material Sciences, Physics or a related scientific field; 2) Previous research with focus in instrumentation development, especially in focused ion beam (FIB) microscopy and/or LEAP; 3) Basic knowledge of (geo-) chemistry, both inorganic and organic; 4) Strong interpersonal skills and the ability to work as part of a team; 5) Strong verbal and written skills. Position to begin in the first quarter of 2018.

Details regarding the competitive compensation package (salary plus benefits) can be obtained from Dr. Alberto Pérez-Huerta ( When submitting a position application, candidates are expected to provide a cover letter, including background and research experience related to the position, a CV, and contact information for two referees. Applications will be reviewed beginning November 15, 2017 and continue until the position is filled. The University of Alabama is an Equal Opportunity Affirmative Action Employer and Actively Seeks Diversity in its Employees.

Thesis in Microscopy:
Atomic-scale correlative microscopy for the study of nanostructural defects, structural and functional properties of individual nano-objects

Host Laboratory: Groupe de Physique des Matériaux (GPM), UMR 6634, Univ. de Rouen Normandie, France

Funding: The PhD is granted by Normandie Université and is available from now and for 3 years

Keywords: Correlative microscopy, transmission electron microscopy, tomography, atom probe tomography, defects, nano-objects.

Description of the project

The aim of this thesis is to propose for the investigation of nanometric defects and nano-objects a set of methodological and instrumental means for combining three-dimensional structural and chemical information. This project is part of an advanced instrumentation approach for materials, especially for advanced materials such as semiconductor nanowires and high temperature aluminum alloys for the transport of electrical energy. The proposed methods are based on the correlation of scanning transmission electron microscopy (STEM) corrected of spherical aberrations and tomographic atom probe (APT). Fields of investigation are related to various topics of materials sciences ranging from current issues in physical metallurgy (stress-precipitation relationships, coupling between defects, structures and composition of stable or metastable precipitates and their precursors) to nanomaterials related topics or nanostructured materials (semiconductor heterostructures). The areas of interest are therefore structural materials, energy transport or conversion, and energy efficiency.

The characterization work will be undertaken on a very high level experimental platform, including state-of-the-art transmission electron microscopes and a set of tomographic atomic probes. This project is a continuation of two ANR Young Researcher projects led by the two supervisors of this thesis.

Description du projet

L’objectif de cette thèse est de proposer pour l’investigation de défauts nanométriques et de nano- objets un ensemble de moyens méthodologiques et instrumentaux permettant de combiner en trois dimensions information structurale et chimique notamment. Ce projet s’inscrit dans une demarche d’instrumentation avancée pour les matériaux, en particulier pour les matériaux avancés tels que les nanofils semi-conducteurs et les alliages d’aluminium haute température pour le transport de l’énergie électrique. Les méthodes proposées sont basées sur la correlation de la microscopie électronique en transmission à balayage (STEM) corrigée des aberrations sphériques et de la sonde atomique tomographique (SAT). Les champs d’investigation touchent diverses thématiques des sciences des matériaux allant de problématiques actuelles en métallurgie physique (relations contrainte-précipitation, couplages entre défauts, structures et composition des précipités stables ou métastables et de leurs précurseurs) aux thématiques liées aux nanomatériaux ou matériaux nanostructurés (hétérostructures semiconductrices). Les domaines touchés sont donc ceux des matériaux de structure, du transport ou de la conversion d’énergie ainsi que de l’efficacité énergétique.

Les travaux de caractérisation seront entrepris sur une plateforme expérimentale de très haut niveau, incluant des microscopes électroniques en transmission corrigés des aberrations sphériques et un parc de sondes atomiques tomographique. Ce projet s’inscrit dans la continuité de deux projets ANR Jeune Chercheur menés par les deux encadrants de cette thèse.

Required skills:

The candidate must have a master's degree in research or engineering. A curriculum of materials physicist is sought. Prior experience in transmission electron microscopy or tomographic atom probe is an advantage but is not required. The candidate must demonstrate the ability to work in a team, demonstrate initiative and be able to quickly work independently on complex instruments. Special skills in algorithmic or image processing would be appreciated but are not mandatory.

Profil recherché:

Le (la) candidat.e recherché.e devra avoir un niveau master 2 recherche ou ingénieur. Un cursus de des matériaux est souhaité. Une expérience préalable en microscopie électronique en transmission ou en sonde atomique tomographique est un avantage mais n’est pas exigée. Le (la) candidat.e devra démontrer son aptitude à travailler en équipe, faire preuve d’initiative et devra être rapidement capable de travailler de manière autonome sur des instruments complexes. Des compétences particulières en algorithmique ou traitement d’image seraient appréciées.

Contacts :

Williams Lefebvre :

Lorenzo Rigutti :


[1] W. Lefebvre-Ulrikson, F. Vurpillot, X. Sauvage, Atom Probe Tomography: Put Theory into Practice, Academic Press (2016).

[2] L. Rigutti et al. Nano Letters, 14(1), 107-114 (2014)

[3] W. Lefebvre et al., Ultramicroscopy 159 (2015) 403-4012.

[4] L. Mancini et al. Appl. Phys. Lett. 108, 042102 (2016)

[5] E. Di Russo et al., Appl. Phys. Lett. (2017)

[6] M. Herbig, et al., Phys. Rev. Lett. 112, 126103 (2014).

[7] M. Kuzmina et al., Science 349 (6252), 1080-1083 (2015).

Materials Analysis Opportunities at Intel:
Sr. Materials Analysis Engineer - 2 positions available

Postdoc position:
TEM/APT analysis of metallic glasses at Max-Planck-Institut fur Eisenforschung
in Dusseldorf, Germany

Project: The project with a duration of three years aims at generating ductile metallic glasses. This was shown to be achievable by controlled partial crystallization via electric heating. However, the underlying mechanisms are not yet clearly understood. In particular in what order what phases form upon heating and how these influence the mechanical behavior requires clarification. The successful applicant will characterize the sequence of crystallization and the mechanisms of deformation by APT and TEM - also in combination on the same specimen.

Applicant: The candidate should have a strong materials science background and should have gathered distinct experimental and analytical skills in either TEM or APT (ideally in both), throughout his / her PhD. Excellent English skills are mandatory. We are an equal-opportunity employer and offer an international, ambitious environment for basic research-oriented candidates who want to perform competitive and cutting-edge research. Salary is determined by the TVöD, level 13. We invite excellent candidates (materials science, physics, engineering) to send a scientific CV including full course and grade documentation as well as transcripts (including grade scale), concise specific motivation letter, the best three publications and at least 2 letters of reference to the email address:

Postdoc position:
Nano-characterization of functionalized glazing stacks by atom probe tomography at Saint-Gobain


Saint-Gobain, the world leader in the habitat and construction markets, designs, manufactures and distributes building materials, providing innovative solutions to meet growing demand in emerging economies, for energy efficiency and for environmental protection. Saint-Gobain Recherche is one of eight major research centres of Saint-Gobain. Based in Paris area, its main research areas are related to glass, layers, surface coatings, building materials and habitat in general.

The thin films department in collaboration with the joint unit SG /CNRS « Surface du Verre et Interfaces » work together to design the functionalized glazing of tomorrow. In the case of insulating glass, this function is obtained by a transparent silver thin coating that reflects infrared radiation. This metal layer is embedded within different layers (metal, oxide, and nitride), in order to adjust optical properties and to protect against corrosion. The characterization of such ultra-thin layers is thus of a great interest to develop new products and improve their energetic performances.

Atom Probe Tomography technique, which is able to characterize the composition of materials at the nanoscale and in 3D, will be mainly applied in this project with the aim to characterize metal layers and their interfaces with the nitrides and oxides.


Isolating glazing stacks comprise several thin layers in the range 0.5 to 30 nm thick. The silver layers (10nm thick) are conventionally deposited on a ZnO layer, usually used as seed layer for crystallization improvement and they are embedded within dielectric layers (SiNx, oxide…) and very thin metal layers (Ti, NiCr…). Depending on the application (windshield, tempered glass), the glazing could be thermally treated at several hundreds of °C: some elements, coming from the different thin layers and from the substrate itself, can diffuse through the stack. The objective of the Post-Doctoral position is to study the behaviour of several layers of these functionalized glasses by means of Atom Probe Tomography technique in order to obtain 3D elemental mappings at the nano-scale.

Under the responsibility of team manager, the candidate will conduct APT characterization on glazing stacks in order to improve the knowledge of this stack at the nano-scale. To this end, he/she is expected to:

- Establish a protocol for tips preparation by FIB, adapted to these materials (glass + coatings)
- Optimize the APT analysis conditions in order to reduce artefacts
- Work on several stacks and coatings
- Report on his/her research activity on a regular basis.

This Post-Doctoral position will be located at RWTH Aachen University, in direct collaboration with Saint Gobain Recherche Center (thin film dept. and SVI joint lab.) This Post-doctoral position will enable the candidate to acquire skills in the field of advanced characterization techniques of thin layers. It will also provide an overview of both academic environment and industrial research opportunities and challenges.

The successful candidate has a PhD with a strong background in a relevant field of thin layer (properties and deposition), physics and/or characterization techniques (eg FIB, SEM…). His / Her approach to research is hands-on, innovative and strongly result-oriented. Good oral and written communication skills (proficiency in French and/or German would be a plus) and the ability to communicate effectively with technical and nontechnical audiences also represent a key requirement for this position.


Oana Cojoracu-Miredin (RWTH):+49 241 80 20270

Denis Guimard(SGR): +33 1 48 39 59 78

Hervé Montigaud (SVI): +33 1 48 39 57 73