International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Monterey Marriott, Monterey, California USA
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
Dr. David Larson of AMETEK will present “Atom Probe Tomography: Toward Improved Productivity and Correlative Analysis in the Semiconductor Industry.” Full schedule details here.