FCMN 2019
International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
April 2 - 4 2019
Monterey Marriott, Monterey, California, USA
Dr. David Larson presenting "Atom Probe Tomography: Toward Improved Productivity and Correlative Analysis in the Semiconductor Industry"
Details
here.
2019 APT User Conference
June 18- 21 2019
Fitchburg, Wisconsin, USA
Details here.