Atom Probe Tomography Webinars
An expanding collection of instructional on-demand webinars and videos on Atom Probe Tomography.
New Video! EIKOS Specimen Crimping and Alignment
This brief, informative video demonstrates the steps needed to prepare a sample for analysis in EIKOS.
An Introduction to Atom Probe Tomography and Its Applications. This short, informative video is the perfect primer on APT. Hosted by Materials Research Society, this webinar covers the basics of APT and explores its utility across a range of applications.
Note that a free membership to Material Research Society is required to access this webinar.
IVAS 101: A Simple Step-by-Step Methodology to Reconstruct 3D Atom Probe Datasets.
CAMECA's Hugues Francois Saint Cyr provides a comprehensive overview of IVAS, the powerful software used in atom probe analyses.
An Introduction to IVAS LT.
If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT.
This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT!
IVAS 3.8: An Overview of the Latest Features
CAMECA's Hugues Francois Saint Cyr discusses the new features in IVAS 3.8. This webinar provides a comprehensive overview of what's new, and how these new features can benefit your research.
IVAS 3.8: 2D Field Evaporation Simulator
Professor Francois Vurpillot provides a comprehensive overview of this powerful enhanced feature in the new IVAS 3.8.
Make the most of your atom probe software by mastering the 2D Field Evaporation Simulator. Dr. Vurpillot is a recognized expert in this area, and will guide you to efficiently and effectively utilize the field evaporation simulator to drive your APT research.
3D Reconstruction and Analysis of Semiconductor Devices.
Semiconductor devices are some of the most complicated samples for Atom Probe Tomography. In this webinar, Hugues Francois Saint Cyr walks you through semiconductor sample preparation and analysis ensuring that you get the APT results you need from your semiconductor development.
Approaching Perfection in Atomic Positioning: From Image Compression and K Factors to Dynamic Considerations PART 1
This brief webinar, hosted by CAMECA's Hugues Francois Saint Cy, focuses on atom probe analysis of metallic materials, with the goal to teach proper navigation of Pole Indexing and ICF Fit in IVAS.
Approaching Perfection in Atomic Positioning: From Image Compression and K Factors to Dynamic Considerations
PARTS 1 and 2
This two-part webinar, hosted by CAMECA's Hugues Francois Saint Cyr and University of Sydney's Alec Day, focuses on atom probe analysis of metallic materials, with the goal to teach proper navigation of Pole Indexing and ICF Fit in IVAS, and using OIM and access to dynamic values of ICF and k factors utilizing codes from the University of Sydney.
Part 1 relies on the use of IVAS in these analyses. Part 2 takes the analyses beyond IVAS into additional research conducted at the University of Sydney.