Atom Probe Tomography Webinars
An expanding collection of instructional on-demand webinars and videos on Atom Probe Tomography.
Introduction to Applications and Technology of EIKOS UV.
Learn about the new EIKOS-UV in this short, informative webinar. Hosted by Robert Ulfig (CAMECA), this webinar will cover the features and functionalities of CAMECA's latest atom probe tomography instrument.
Includes the live Q&A session, all available on demand. Click here.
Data Navigation and Filtering Options in AP Suite 6
The first in a series of webinars covering the powerful feature set of AP Suite 6!
Hosted by Katherine Rice (CAMECA), this short webinar will cover how to quickly and easily find your projects, specimens, experiments, and reconstructions in Data Navigator. We'll review simple and complex filters, and provide instruction on how to keep your data organized by using project structures.
This webinar is the first in a series designed to help you make the most of your atom probe data. Don't miss it! Make AP Suite 6 your one-stop APT data show.
Click here!
Vacuum Cryo Transfer Module: A Suitcase Solution
Hosted by Katherine Rice (CAMECA), and featuring Rob Ulfig (CAMECA), Peter Clifton (CAMECA), Urs Maier (Ferrovac) and Rick Passey (Thermo Fisher Scientific) during the live Q&A session, this webinar will provide an overview of cutting-edge cryo transfer work being done with atom probe tomography.
Why Cryo Transfer?
Cryo transfer can enable or improve the ability to collect atom probe data in difficult applications, such as:
~Rapid oxidation studies (e.g. uranium, lithium, aluminum)
~Catalyst/reaction chamber studies of surface contamination
~Characterization of hydrogen embrittlement of steel
~Transport between various analysis modalities (e.g. FIB, TEM) under vacuum conditions
~Analysis of "soft" (i.e. biological) materials
Vacuum Cryo Transfer Module: A Suitcase Solution, will provide an overview of this exciting investigative approach and answer your questions with by a live Q&A with industry experts!
Click here for the webinar!
Approaching Perfection in Atomic Positioning: From Image Compression and k Factors to crystallography mediated reconstruction.
Part 1 of this webinar series, hosted by Hugues Francois-Saint-Cyr of CAMECA and Alec Day of the University of Sydney, deals with pole positioning and IVAS.
This webinar, complete with audience Q&A, is now available on demand:
Approaching Perfection in Atomic Positioning: From Image Compression and k Factors to crystallography mediated reconstruction, Part 1.
Part 2 of this webinar series, hosted by Alec Day and Hugues Francois-Saint-Cyr, takes a closer look at the role of crystallography in the APT reconstruction process, including:
--A recap of the calibration procedure for ICS and kf;
--A full assessment of the reconstruction parameters;
--Methods to unveil hidden crystallographic information; and
--An introduction to Crystallography Mediated Reconstruction.
This webinar, complete with audience Q&A, is also available on demand at the following link:
Approaching Atomic Perfection Part 2: Crystallography Mediated Reconstruction
Atom Probe Tomography for Additive Manufacturing.
Part 1 deals with maraging steel. Click the link below to watch this short webinar with a Q&A session:
Atom Probe Tomography of Additively Manufactured Materials, Part 1: Intro to AM Methods and Maraging Steel Case Study.
Part 2 deals with Titanium and Nickel Superalloys. Clink the link below to watch this short webinar with a Q&A session:
Atom Probe Tomography of Additively Manufacture Materials, Part 2: Titanium and Nickel Superalloys
Webinar Series on Catalyst Materials analyzed by Atom Probe Tomography!
These three short on-demand webinars explore the use of APT in analyzing zeolites.
These webinars were produced by
CAMECA's Hugues Francois Saint Cyr, with additional assistance from experts listed below.
Atom Probe Analysis of Catalyst Materials PART 1: Aluminum Tracking in Steamed ZSM-5 Zeolites
With assistance from Dr. Danny Perea et al. at PNNL; Professors Bert Weckhuysen and Dr. Joel Schmidt at Utrecht University, and Dr. Simon Bare, Stanford.
This webinar incorporates materials from:
NATURE COMMUNICATIONS | 6:7589 | DOI: 10.1038/ncomms8589
Angew. Chem. Int. Ed. 2016, 55, 11173 –11177
NATURE COMMUNICATIONS | 8: 1666| DOI: 10.1038/s41467-017-01765-0
M. K. Miller et al., Ultramicroscopy 2005, 102, 287
K. Thompson et al., Ultramicroscopy 2007, 107, 131
M. K. Miller et al. Microscopy & Microanalysis 2007,13(6), 428
D. J. Larson et al., Ultramicroscopy 1999, 79, 287
K. Thompson et al, Microscopy & Microanalysis 2006, 12(S2), 1736CD
K. Thompson et al., Ultramicroscopy 2007, 107, 131
Atom Probe Analysis of Catalyst Materials PART 2: 13-Carbon Monitoring in Coked ZSM-5 Zeolites
With assistance from Dr. Jon Poplawsky et al. at ORNL; Professors Bert Weckhuysen and Dr. Joel Schmidt at Utrecht University, and Dr. Simon Bare, Stanford.
This webinar incorporates materials from:
Schmidt, J. E., et al. (2016). Angew. Chem., Int. Ed., 1–6. http://doi.org/10.1002/ange.201606099
Atom Probe Analysis of Catalyst Materials PART 3: Deactivation Mechanism in NOx Conversion in Cu-Exchanged Zeolites
With assistance from Dr. Jon Poplawsky et al. at ORNL; Professors Bert Weckhuysen and Dr. Joel Schmidt at Utrecht University, and Dr. Simon Bare, Stanford.
This webinar incorporates materials from:
NATURE COMMUNICATIONS | DOI: 10.1038/s41467-017-01765-0
Best Practices for Microtip Coupon Handling
This video walks the user through the steps and techniques needed to load a microtip coupon for analysis.
EIKOS Specimen Crimping and Alignment
This brief, informative video demonstrates the steps needed to prepare a sample for analysis in EIKOS.
An Introduction to Atom Probe Tomography and Its Applications. This short, informative video is the perfect primer on APT. Hosted by Materials Research Society, this webinar covers the basics of APT and explores its utility across a range of applications.
Note that a free membership to Material Research Society is required to access this webinar.
IVAS 101: A Simple Step-by-Step Methodology to Reconstruct 3D Atom Probe Datasets.
CAMECA's Hugues Francois Saint Cyr provides a comprehensive overview of IVAS, the powerful software used in atom probe analyses.
An Introduction to IVAS LT.
If you have atom probe data, and are looking for an efficient and free method to conduct analyses, check out IVAS LT.
This free version of IVAS software allows you to conduct a number of different tests on your data. Learn more by watching this free, short webinar, and then download your copy of IVAS LT!
IVAS 3.8: An Overview of the Latest Features
CAMECA's Hugues Francois Saint Cyr discusses the new features in IVAS 3.8. This webinar provides a comprehensive overview of what's new, and how these new features can benefit your research.
IVAS 3.8: 2D Field Evaporation Simulator
Professor Francois Vurpillot provides a comprehensive overview of this powerful enhanced feature in the new IVAS 3.8.
Make the most of your atom probe software by mastering the 2D Field Evaporation Simulator. Dr. Vurpillot is a recognized expert in this area, and will guide you to efficiently and effectively utilize the field evaporation simulator to drive your APT research.
3D Reconstruction and Analysis of Semiconductor Devices.
Semiconductor devices are some of the most complicated samples for Atom Probe Tomography. In this webinar, Hugues Francois Saint Cyr walks you through semiconductor sample preparation and analysis ensuring that you get the APT results you need from your semiconductor development.
Approaching Perfection in Atomic Positioning: From Image Compression and K Factors to Dynamic Considerations PART 1
This brief webinar, hosted by CAMECA's Hugues Francois Saint Cy, focuses on atom probe analysis of metallic materials, with the goal to teach proper navigation of Pole Indexing and ICF Fit in IVAS.
Approaching Perfection in Atomic Positioning: From Image Compression and K Factors to Dynamic Considerations
PARTS 1 and 2
This two-part webinar, hosted by CAMECA's Hugues Francois Saint Cyr and University of Sydney's Alec Day, focuses on atom probe analysis of metallic materials, with the goal to teach proper navigation of Pole Indexing and ICF Fit in IVAS, and using OIM and access to dynamic values of ICF and k factors utilizing codes from the University of Sydney.
Part 1 relies on the use of IVAS in these analyses. Part 2 takes the analyses beyond IVAS into additional research conducted at the University of Sydney.