Consumables, Accessories, and Options

Atom Probe Tomography
Consumables, Accessories, and Options
   

LEAP 2019EIKOS 2019
 
   
   
Pricing information and order support is available from your regional CAMECA Sales Representative. Please reference the contact list below to identify your CAMECA Sales Region and corresponding email address.
   
North America: Support US
Europe, Russia, and the Middle East: Support France
                                                    Support Germany 
Japan: Support Japan
Korea: Support Korea
Taiwan: Support Taiwan
China: Support China
Australia: Support Australia
India: Support India
   
CONSUMABLES  
Local Electrode Assembly (New)  
Local Electrode (Refurbished)  
LEAP Quality Assurance Test Kit  
Consumables Credit Package   
Presharpened Microtip™ Coupons (PSM M36)  
Microtip for FIB Liftout Mounting (FT M36 - LEAP 3000)  
Microtip Coupons for FIB Liftout (M22)  
Microtip Coupons for Automated FIB Liftout (M22)  
Spare Parts Kit  
ARM™ replacement needles  
Cu Spring Clip Replacement  
Small ID Sample Stub (copper crimps)  
Medium ID Sample Stub (copper crimps)  
Large ID Sample Stub (copper crimps)  
Grooved Sample Stub, 0.9mm ID (copper crimps)  
Grooved Sample Stub, 0.5mm ID (copper crimps)  
3DAP Sample Stub (Ni crimps)  
Specimen, Test, Aluminum  
Specimen, Test, Stainless-Steel  
Specimen, Test, Tungsten  
Silver Epoxy Kit  
FIM Gas Bottle Refill  
Correlative Microscopy Grid, 10 pack  
nanoMesh™ Correlative Microscopy Grid, 10 pack  
FIB ready wire mounting post, 8 pack  
Wire for Aluminum Specimen Preparation  
Hardened Wire Cutters  
 
 
ACCESSORIES  
AP Suite 6.X Data Analysis Software Licenses  
AP Suite Data Analysis Computers  
IVAS 3.X Software License  
IVAS Computers  
Simplex ElectroPointer™  
Manual Electropolish Station  
Local Electrode Test Flat Kit  
Microtip™ Accessory Kit  
Specimen Puck  
Four Specimen Puck  
Copper Spring Clip Microtip Stub  
Tilted (45 degrees) Specimen Holder  
FIB Stage Pedestal Kit  
Angled wire holder for Quickloader systems  
Carousel Handling Tool  
Puck Handling Tool  
Carousel Assembly  
Local Electrode Shipping Assembly  
Specimen Holder Assembly (SEM and FIB)  
Vertical Wire Holder for FIB/SEM  
Horizontal Wire Holder for FIB/SEM  
STEM Holder for FIB  
Specimen Shipping Assembly  
Specimen Holder Assembly  
FIM Gas Bottle  
Specimen Puck Assembly, Integrated Electrode  
Integrated Counter Electrode Alignment Station  
Integrated Counter Electrode Shipping Assembly  
Specimen Shipping Assembly for EIKOS  
Specimen Holder Assembly for EIKOS  
Integrated Counter Electrode Carousel for EIKOS  
Atom Probe Stub Crimper  
   
Accessories Packages:  
Metallurgical Application Package  
FIB-Based Application Package
 
EIKOS Application Package
 
Training/Consulting Packages  
 
 
OPTIONS  
Integrated Plasma Treatment System  
VCTM - Vacuum Cryo Transfer Module  
HDeFIM (Optional on 4000X Si and 5000 S)  
Productivity Enhancement Package  
Active Vibration Isolation Platform for LEAP  
 
 
   
Consumables  
   
   
Local Electrode Assembly (New)
Pre-cleaned, tested, and UHV packed. Aperture openings specified between
30 to 60 microns with less than 5 microns variance X to Y (roundness).
(Must also order shipment case PN 21400 or supply one).

Part number: 24603, 24047 (pack of 8, includes shipping case).
Lead time (ARO): 4 weeks.

 
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Local Electrode (Refurbished)
Refurbished Local Electrodestm (new cone electrode), pre-cleaned, tested to new specifications and UHV packed. Aperture openings specified between 30 to 60 microns with less than 5 microns variance X to Y (roundness).
*Original core electrode pucks must be returned.
**If an empty specimen puck is included in the shipment block,
a FREE PN 23210 test flat will be included.


Part number: 24603-R
Lead time (ARO): 4 weeks from the receipt of core electrode pucks.
 
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LEAP Quality Assurance Test Kit
Specimens prepared specifically for testing and QA checks of the LEAP® instrument, 10 aluminum specimens, on presharpened microtip coupon, and one local electrode test flat. Includes Specimen Shipping Assembly (PN 21385).

Part number: 21772
Lead time (ARO): 2 weeks
 
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Consumables Credit Package
Provides a credit redeemable against future consumable requirements (supplied at list price up to a maximum value of $25,000). Ask your local sales representative for details.
*Expires two years from the date of purchase.

Part number: 23886
Lead time (ARO): Ask your local sales representative for details.
 
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Presharpened Microtip™ Coupons (PSM M36)
36-specimen grid of presharpened microtips (tapering to a sharp point less than 50nm in diameter); height 100 micron +/- 20 micron on a 3mm X 7mm (+/- 0.2mm) silicon coupon doped to less than 0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included). Guaranteed> 80% of the tips are viable on shipment.

Part number: 21611 (pkg. of 10); 21505 (per each)
Lead time (ARO): 2 weeks
 
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Microtip for FIB Liftout Mounting (FT M36 - LEAP 3000)
36-specimen grid of flat top microtips with diameter 2 microns +/- 1 micron; height 110 micron +/- 20 micron on a 3mm X 7mm (+/- 0.2mm) silicon coupon doped to <0.1 Ohn-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included). Guaranteed > 80% of the tips are viable on shipment. Not recommended for LEAP 4000X and 5000X platforms.

Part number: 21909 (pkg. of 10); 21753 (per each)
Lead time (ARO): 2 weeks
 
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Microtip Coupons for FIB Liftout (M22)
22-specimen grid of flat top microtips with tips located with 400 microns of the edge of the microtip coupon. Diameter 2 microns +/- 1 micron; height 125 microns +/- 20 microns on a 3mm X 7mm (+/- 0.3mm - thicker) silicon coupon doped < 0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included PN 23739). Guaranteed > 80% of the tips are viable on shipment.

Part number: 23265 (pack of 10); 23264 (per each)
Lead time (ARO): 2 weeks

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Microtip Coupons for Automated FIB Liftout (M22)
22-specimen grid of flat top microtips with tips located within 400 microns of the edge of the microtip coupon. Diameter 2 microns +/- 1 micron; height 125 microns +/- 20 micron on a 3mm X 7mm (+/- 0.3mm - thicker) silicon coupon doped <0.1 Ohm-cm resistivity. Shipped in packages of 10 coupons, requires mounting to planar sample stub (not included PN 23739). Optimized for automated sample preparation procedures.

Part number: 26880 (pack of 10)
Lead time (ARO): 2 weeks
 
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Spare Parts Kit
Contains:
  • Screws, set screws, and washers for pucks
  • Screws for microtip spring clips
  • Replacement cover and base for the 18-position sample holder
  • Allen keys for tightening specimen puck set screws and specimen storage set screws
Part number: 24407
Lead time (ARO): 2 weeks
 
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ARM™ replacement needles
Pre-bent replacements for the rotation needle on ARM stages (PN 23213). Comes as a package of two.

Part number:23917 (ARM lll); 24780 (ARM lV Rotoprobe)
Lead time (ARO): 2 weeks
 

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Cu Spring Clip Replacement
Replacement clips for spring clip microtip stubs PN 23739. Comes as a package of 5.

Part number: 24501
Lead time (ARO): 2 weeks
 
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Small ID Sample Stub (copper crimps)
Pre-cleaned and UHV packaged in quantities of 100 each. General use stubs for wire samples. Inside diameter 0.4mm. OD 1.8mm. 8mm length.

Part number: 21609
Lead time (ARO): 2 weeks
 
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Medium ID Sample Stub (copper crimps)
Pre-cleaned and UHV packaged in quantities of 25 each. Precision inside diameter measures 1.0mm - accepts 3DAP Ni crimps (see PN 23863). OD 1.8mm. 14mm length.

Part number: 22933
Lead time (ARO): 2 weeks

Also available with an 8mm length, packet of 25. -SHORT

Part number: 24508
Lead time (ARO): TBD
 
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Large ID Sample Stub (copper crimps)
Pre-cleaned and UHV packaged in quantities of 100 each.  Inside diameter measures 1.4mm.
OD 1.8mm. 8mm length.

Part number: 21610
Lead time (ARO): 2 weeks.
 
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Grooved Sample Stub, 0.9mm ID (copper crimps)
Pre-cleaned and UHV packaged in quantities of 25 each. Inside diameter measures 0.9mm.
OD 1.8mm. 8mm length

Part number: 25961
Lead time (ARO): 2 weeks
 
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Grooved Sample Stub, 0.5mm ID (copper crimps)
Pre-cleaned and UHV packaged in quantities of  25 each. Inside diameter measures 0.5mm.
OD 1.8mm. 8mm length.

Part number: 25963
Lead time (ARO): 2 weeks
 
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3DAP Sample Stub (Ni crimps)
Precision Ni crimp for use in 3DAP™ systems. Fits inside Medium ID Sample Stubs PN 22933. Pre-cleaned and UHV packaged in quantities of 25 each.
OD 1.0mm, ID 0.8mm. 5mm length.

Part number: 23863
Lead time (ARO): 2 weeks
 3DAP Sample Stub Ni Crimps
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Specimen, Test, Aluminum
Single aluminum specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN 21385).

Part number: 21634
Lead time (ARO): 2 weeks
 
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Specimen, Test, Stainless-Steel
Single stainless-steel specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN 21385).

Part number: 21635
Lead time (ARO): 2 weeks
 
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Specimen, Test, Tungsten
Single tungsten specimen prepared specifically for testing and calibrating the LEAP instrument. (Must also order container PN 21385).

Part number: 21636
Lead time (ARO): 2 weeks
 
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Silver Epoxy Kit
Conductive epoxy (silver embedded) for mounting specimens to stubs - especially for mounting microtip coupon samples to planar stubs without the use of a spring clip. Price and availability subject to change.

Part number: 21614
Lead time (ARO): 4 weeks
 
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FIM Gas Bottle Refill
You must obtain an RMA number before shipping the bottles back to us. **Contact service for installation quotation.

Part number: 21009-R
Lead time (ARO): 4 weeks
 
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Correlative Microscopy Grid, 10 pack
Nominally non-magnetic stainless steel grids for correlative microscopy applications such as tEBSD/FIB/SEM. Four (4) mounting posts per grid, electropolishing recommended before FIB mounting specimens.

Part number: 25252
Lead time (ARO): TBD
 
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nanoMesh™ Correlative Microscopy Grid, 10 pack
Non-magnetic silicon 2x3 micron posts ready for FIB LO on a 3mm molybdenum grid for correlative microscopy applications such as tEBSD/FIB/TEM/SEM. Five (5) mounting posts per grid optimized for use with a Hitachi NX9000 FIB, but compatible with any 3mm grid holder.

Part number: XXXXX
Lead time (ARO): TBD
 
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FIB ready wire mounting post, 8 pack
Tungsten needle pre-crimped in copper stub. Shipped in a 25480 round shipping container. Specimens will accommodate a FIB liftout for EIKOS or TEM. Note, the end radius of the needle is approximately 1.2 microns and it is recommended that the end be milled flat in the FIB prior to mounting a liftout. User can follow the procedure in TN-08.

Part number: 26126
Lead time (ARO): TBD
 
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Wire for Aluminum Specimen Preparation
Aluminum wire, 0.25mm (0.01in) diameter, annealed. 99.999% (metals basis).

Part number: 21637
Lead time (ARO): 2 weeks
 
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Hardened Wire Cutters
Silicon carbide coated jaws that will not deform when cutting materials such as tungsten for atom probe sample preparation.

Part number: 25989
Lead time (ARO): 2 weeks
 
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ACCESSORIES  
   
   
AP Suite 6.X Data Analysis Software Licenses
Software license that enables full use of the AP Suite 6 IVAS, Data Navigator, and Asset Manager Modules.
 
   
AP Suite 6.X Data Analysis dongle license

Part number: 27156
Lead time (ARO): 2 weeks
 
   
AP Suite 6.X Data Analysis software license

Part number: 27159
Lead time (ARO): 2 weeks
 

 
AP Suite License upgrade from 3.X via dongle swap (*requires prior return of existing dongle)

Part number: 27172
Lead time (ARO): 4 weeks*
 
   
AP Suite Manual (Printed)

Part number: 27151
Lead time (ARO): 2 weeks
 
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AP Suite Data Analysis Computers  
   
AP Suite Data Analysis Workstation

Desktop workstation with license dongle

Part number: 27198
Lead time (ARO): 6 weeks
 
   
Pre-configured with AP Suite, no license

Desktop workstation - no license

Part number: 27199
Lead time (ARO): 6 weeks
 
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IVAS 3.X Software License
Software dongle that enables full use of the IVAS 3.X reconstruction and analysis capabilities.
IVAS Software 3.8.X license

Part number: 23890
Lead time (ARO): 2 weeks
 
   
IVAS license upgrade via dongle swap
(*requires prior return of existing dongle)

Part number: 23898
Lead time (ARO): 4 weeks*
 
   
IVAS, Days of Use, minimum 10 days

Part number: 23897
Lead time (ARO): 2 weeks
 
   
IVAS, TEAM 3D IQ

Part number: 24758
Lead time (ARO): 2 weeks
 
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IVAS Computers  
   
IVAS™ Workstation
Desktop workstation with license

Part number: 23900
Lead time (ARO): 6 weeks
 
   
Pre-configured with IVAS, no license
Desktop workstation - no license

Part number: 21645
Lead time (ARO): 6 weeks
 
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Simplex ElectroPointer™
The ElectroPointer system is designed to ease the production of high-quality samples for analysis in the LEAP® microscope. The ElectroPointer consists of the electropolisher and control software, which allow setting parameters to optimally produce tips in a number of materials. V2 includes automatic and a manual (push button) modes. System does not include the required PC to operate.

Part number: 22403
Lead time (ARO): 12 weeks
 
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Manual Electropolish Station
The Manual Electropolish Station is designed to allow flexibility for producing a wide variety of electropolished specimens with an integrated microscope. Includes a power supply, 50X - 500X binocular microscope, wi-fi camera, and accessories necessary to make high-quality LEAP specimens (reagents not included, also available without the microscope/camera).

Part number: 24499; 25442 (without microscope)
Lead time (ARO): 12 weeks
 
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Local Electrode Test Flat Kit
One piece of polished refractory alloy, ideal for performing electrode testing (instructions provided). Testing flat comes with an 18-position sample holder (PN 21385).

Part number: 23211
Lead time (ARO): 2 weeks
 
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Microtip™ Accessory Kit
All the tools you need to start using microtip coupons. Kit includes:

  • Two pre-sharpened microtip coupons for QA (PN 21505)
  • Two flat-topped coupons for FIB LO (PN 23264)
  • A set of tweezers optimized for handing (PN 22057 and PN 22058)
  • A set of five spring clip microtip stubs (PN 23739)
  • General use flat round topped stub, qty. 25 (PN 21600)


Part number: 22056
Lead time (ARO): 4 weeks

 
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Specimen Puck
Pre-cleaned and UHV-wrapped to ensure vacuum system cleanliness. Accepts sample stubs 1mm to 2.1mm in diameter.

Part number: 20125
Lead time (ARO): 2 weeks
 
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Four Specimen Puck
Pre-cleaned and UHV-wrapped to ensure vacuum system cleanliness. Accepts sample stubs 1mm to 2.1mm in diameter.

Part number: 23199
Lead time (ARO): 4 weeks
 
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Copper Spring Clip Microtip Stub
The copper alloy spring clip microtip stub (shown in a specimen puck assembly, not included) is a self-aligning, re-usable microtip stub which does not require epoxy but instead holds the microtip using a spring clip. The design provides convenient, reliable operation and enables additional processing (e.g. depositions) after the initial atom probe work has been completed. The new low-profile design out of a non-magnetic alloy is ideal for use in low working distance FIB systems. (Stub only 22001)

Part number: 23739
Lead time (ARO): 2 weeks
 
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Tilted (45 degrees) Specimen Holder
Pre-tilted 45-degree specimen holder for FIB/SEM/transmission EBSD applications. Two set screws hold the copper stub or wire crimp securely. Can be used for transmission EBSD on microtip coupons. Coupon and stub not included.

Part number: 25477
lead time (ARO): 2 weeks
 
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Advanced Specimen Prep Kit (V3)
Contains all of the parts necessary for FIB liftout sample preparation for a wide variety of geometries, including:
  • Aluminum base (PN 23108)
  • Allen hex keys (PN 21388 and 21520)
  • Tweezers (PN 22057)
  • TEM grid holder (PN 26883)
  • Tilted (45 degree) specimen holder (PN 24413)
  • Specimen preparation stage (PN 24776)
  • Specimen preparation stage with rotation arm (PN 24779)
  • Integrated storage of tools in base
Part number (entire kit): 23110.  Latest version of individual parts will be included at time of sale.
Lead time (ARO): 6 weeks
 
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Specialized Specimen Stages
The Advanced Sample Preparation Kit ships with an ARM4™ stage with integrated Rotation Manipulator™ arm that allows complex geometry, site-specific sample preparation, and an ALPS Advanced Liftout and Preparation State™ for load-lock compatible FIB liftout with flexible work flows.

(Can be purchased separately as PN 24779 or 24776)
 
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FIB/LEAP TEM Grid Holder
Included in the Advanced Specimen Prep Kit, this part allows for transferring TEM grid-mounted samples between the LEAP and a FIB system without extra handling. The design allows safe, one-handed loading and unloading.

(Can be purchased separately as PN 26883)
 
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Transmission EBSD Kit
Contains a comprehensive set of parts to facilitate transmission EBSD-assisted specimen preparation:

  • FIB LEAP TEM grid holder
  • Correlative microscopy grid, 10 pack
  • Tilted (45 degree) specimen holder
  • FIB stage pedestal kit
  • Angled microtip coupon holder for Quickloader systems
Part number (entire kit): 26066
 
   
FIB/LEAP TEM Grid Holder
Allows for transferring TEM grid-mounted samples between the LEAP and FIB systems without extra handling. The design allows safe, one-handed loading and unloading.

(Can be purchased separately as PN 26883)
 
   
Correlative Microscopy Grid, 10 pack
Nominally non-magnetic stainless-steel grids for correlative microscopy applications such as tEBSD/FIB/SEM. Four (4) mounting posts per grid; electropolishing recommended before FIB mounting specimens.

(Can be purchased separately as PN 25252)
 
   
Titled (45 degrees) Specimen Holder
Pre-tilted 45-degree specimen holder for FIB/SEM/transmission EBSD applications. Two set screws hold the copper stub or wire crimp securely. Can be used for transmission EBSD on microtip coupons. Coupon and stub not included.

(Can be purchased separately as PN 25477)
 
   
FIB Stage Pedestal Kit
A series of four stage pedestals of varying heights that make it possible to perform t-EBSD or other FIBoperations on larger samples.

(Can be purchased separately as PN 24653)
 FIB stage pedestal kit
   
Angled wire holder for Quickloader systems
A quickloader-compatible shuttle for wire specimen transmission EBSD. The angled position makes it easier to mill and map with minimal stage movements. Accommodates two (2) microtip coupon stubs (not included).

Part number: 25093
 
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Carousel Handling Tool
Used to insert and remove carousels from the load lock and to control the carousel during specimen puck insertion.

Part number: 20799
Lead time (ARO): 2 weeks
 
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Puck Handling Tool
Used to load and lock specimen pucks into carousel or storage location positions. The standard five-inch handle model also is available with a twelve-inch handle for use with radioactive specimens.

Part number: 24888
Long handle part number: 20900
Lead time (ARO): 2 weeks
 
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Carousel Assembly
Pre-cleaned and vacuum system tested. Numbered and indexed, contains positions for combination of up to six (6) specimen pucks and/or local electrode pucks.

NOTE: Heated carousels are available for systems with the productivity enhancement package.

part number: 20099 (4000); 24627 (5000)
Lead time (ARO): 4 weeks
 
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Local Electrode Shipping Assembly
Covered aluminum block protects up to eight (8) local electrodes or specimen pucks for shipping or short-term storage.

Part number: 21400
Lead time (ARO): 2 weeks
 
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Specimen Holder Assembly (SEM and FIB)
Used to transfer up to ten (10) wire samples of five (5) coupons directly on to the eucentric stage of a FIB or SEM tool for measurement and analysis.

Part number: 21380
Lead time (ARO): 2 weeks
 
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Vertical Wire Holder for FIB/SEM
For specimen preparation on wire specimens for LEAP or EIKOS. The wire holder has a standard pin mount on the base and six (6) wire positions for PN 26127 or similar crimped wires. Two spring clips at the top can hold samples for liftout. See Technical note TN-08 for procedures for liftout to wire specimens.

Part number: 24673
Lead time (ARO): 2 weeks
 
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Horizontal Wire Holder for FIB/SEM
For specimen preparation on wire specimens for LEAP or EIKOS. The wire holder has a standard pin mount on the base and six (6) wire positions for PN 26127 or similar crimped wires. This holder can accommodate wire specimens for cutting a flat surface for FIB mounting. See Technical Note TN-08 for procedures for liftout to wire specimens.

Part number: 25100
Lead time (ARO): 2 weeks
 
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STEM Holder for FIB
Angled holder to enable FIB specimen prep and STEM imaging with removable insert for up to twelve (12) wire specimens. Can also hold microtip coupon stubs for STEM analysis. May not be compatible with all FIBs.

Part number: 25450
Lead time (ARO): 2 weeks
 
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Specimen Shipping Assembly
Plastic cover protects up to 18 wire specimens for storage or shipping. May also be used to store or ship coupon samples.

Part number: 21385
Lead time (ARO): 2 weeks
 
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Specimen Holder Assembly
Plastic cover protects up to 48 wire specimens for storage or shipping. May also be used to store or ship coupon samples.

Part number: 21390
Lead time (ARO): 2 weeks
 
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FIM Gas Bottle
Gas bottles are pre-baked and filled with argon, neon, or helium. Gas bottles are filled to a pressure of five (5) inches of water and are guaranteed to contain purity to 99.999%.

Part number: 21436
Lead time (ARO): 6 weeks. Does not include installation.
 
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Specimen Puck Assembly, Integrated Electrode
Specimen puck, numbered C-washer, and electrode top hat for use in EIKOS™ platforms.

Part number: 25310
Lead time (ARO): 2 weeks
 
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Integrated Counter Electrode Alignment Station
Complete ex-situ alignment station for integrating specimens with the counter electrode pucks for EIKOS™. Comes with computer and CamAlign™ software to accurately confirm the specimen position within the counter electrode.

Part number: 25346
Lead time (ARO): 2 weeks
 
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Integrated Counter Electrode Shipping Assembly
Specimen puck block that can accommodate ten (10) EIKOS pucks with integrated counter electrodes for shipping or storage.

Par number: 25770
Lead time (ARO): 2 weeks.
 
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Specimen Shipping Assembly for EIKOS
Similar to PN 21385, this specimen shipping container is anodized and contains soft tipped set screws to avoid deforming EIKOS specimens. Plastic cover protects up to 18 wire specimens for storage or shipping.

Part number: 25480
Lead time (ARO): 4 weeks
 
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Specimen Holder Assembly for EIKOS
Similar to PN 21390, this specimen holder is anodized and has soft tipped set screws to avoid deforming EIKOS specimens. Plastic cover protects up to 48 wire specimens for storage or shipping. May also be used to store or ship coupon samples.

Part number: 25958
Lead time (ARO): 4 weeks
 
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Integrated Counter Electrode Carousel for EIKOS
Pre-cleaned and vacuum system tested. Numbered and indexed, contains positions for combinations of up to five (5) integrated counter electrode pucks.
LEAP 5000 carousels hold up to eight (8) pucks.

Part number: 25302
Lead time (QOR): 4 weeks
 
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Atom Probe Stub Crimper
Conveniently crimps bare wire in Cu stub for handling, electropolishing, and atom probe. Camera with software allows the user to set a target height for EIKOS or other applications. Lever crimps specimen into stub by applying equal pressure so as to not deform the specimen.

Part number: 25742
Lead time (ARO): 4 weeks
 
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Accessories Packages:  
   
   
Metallurgical Application Package:
Provides a comprehensive package of accessories and consumables to supply a typical group concentrating on metallurgical sample analysis for approximately one year. Includes the following:

  • Carousel handling tool
  • Puck handling tool, short
  • Eight (8) position carousel (5000)
  • Ten (10) position specimen holder for FIB/SEM
  • Specimen shipping assembly
  • 48 position specimen storage block
  • 2x Local Electrode shipping case
  • Kit, small ID copper crimps
  • 2x Kit, large ID copper crimps
  • Kit, medium ID copper crimps
  • Pre-sharpened microtip coupon
  • QA specimen kit
  • Advanced specimen prep kit
  • 6x four-specimen puck
  • Local electrode test flat
  • 8x 22-tip microtip coupons for FIB liftout
  • Replacement spring clips for microtip stubs, five (5) pack
  • 5x copper spring clip microtip stubs
  • 10x local electrode aperture pucks
  • ARM replacement arm
  • Vertical wire holder for FIB/SEM
Part number: 24966. Latest version of parts ship.

Ask your salesperson for details. LEAP 4000 and 5000 systems have different part numbers.
 
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FIB-Based Application Package:
Provides a comprehensive package of accessories and consumables to supply a typical group concentrating on FIB-based sample analysis for approximately one year. Includes all of the following:
  • Carousel handling tool
  • Puck handling tool, short
  • Eight (8) position carousel (5000)
  • 2x Specimen shipping assembly
  • 48 position specimen storage block
  • 2x Local electrode shipping case
  • Kit, large ID copper crimps
  • Kit, medium ID copper crimps
  • 2x Pre-sharpened microtip coupon
  • QA specimen kit
  • Advanced specimen prep kit
  • Four-specimen puck
  • Local electrode test flat
  • 8x 22-tip microtip coupons for FIB liftout
  • Replacement spring clips for microtip stubs, five (5) pack
  • 15x copper spring clip microtip stubs
  • 16x local electrode aperture pucks
  • Spare rotoprobe for FIB/SEM stage
  • Vertical wire holder for FIB/SEM
Part number: 24968. Latest version of parts ship.

Ask your salesperson for details. LEAP 4000 and 5000 systems have different part numbers.
 
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EIKOS Application Package:
Provides a comprehensive package of accessories and consumables to supply a typical group concentrating on atom probe with EIKOS for approximately one year. Includes all of the following:
  • Carousel handling tool
  • Puck handling tool, short
  • Five (5) position carousel
  • 15x Specimen Puck Assembly including a new Integrated Counter Electrode
  • 2x Integrated Counter Electrode shipping assemblies
  • 2x 48 position specimen storage block (EIKOS)
  • Specimen shipping container (EIKOS)
  • Kit, large ID standard copper crimps (100 pieces)
  • Kit, medium ID standard copper crimps (100 pieces)
  • 2x Kit, Grooved stubs, 0.9mm ID (50 pieces)
  • 2x Kit, Grooved stubs, 0.5mm ID (50 pieces)
  • 5 Specimen, test, aluminum
  • Hardened wire cutters
  • 6x FIB-ready specimen wires, eight (8) pack (48 total)
  • Vertical wire holder stage for FIB/SEM
  • Horizontal wire holder stage for FIB/SEM
  • STEM specimen holder
  • Tilted (45 degree) specimen holder stage for FIB/SEM
  • Spare parts kit, EIKOS
Part number: 25987. Latest version of this kit included, minor variations may occur.

Ask your salesperson for details.
 
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Training/Consulting Packages:

Standard Installation Training:
2 Day LEAP Operations Basics, Part number: 24502
5 Day APT Intro (Modules 1-5), Part number: 23901

Additional Training Packages:
5 Day Advanced APT Training, Part number: 23904
5 Day Advanced Specimen Prep/LEAP, Part number: 23905
5 Day Advanced Data Analysis, Part number: 23906
Custom support and training packages (ask your salesperson), Part number: 24596.
 
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Options  
   
   
Integrated Plasma Treatment System
Plasma treatment system attached to the LEAP® load lock provides surface contamination removal enabling faster pump-down and enhanced Local Electrode™ performance. The plasma treatment option offers both increased productivity and reduced cost of ownership for the LEAP system. The system can extend the operating lifetime of local electrodes > 2 times.

Part number: 22803 (5000 only). For 4000 systems, please ask your salesperson.
Lead time (ARO): 12 weeks.
 
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VCTM - Vacuum Cryo Transfer Module
The Vacuum and Cryo Transfer Module (VCTM) enables specimens to be transported between a LEAP and ancillary workstations while maintaining both UHV and cryogenic conditions. The module utilizes a UHV-compatible portable chamber which is fully integrated (via a docking station) into the LEAP 5000 hardware and software. Note that additional ancillary workstations must also be compatible with the VCTM, and are not included with this option. The package includes all necessary components and:
  • 23887 Low Profile VCTM Compatible Specimen Puck
  • 26002 Cryo Carousel with an Insulated Position and Integrated Heater
  • 26006 Cryo Carrier Puck (Piggyback Puck)
Part number: 26146 (5000 only)
Lead time (ARO): 12 weeks
 
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HDeFIM (Optional on 4000X Si and 5000 S)
Up to three gases can be mounted to the manifold, allowing static or dynamic digitally-recorded FIM. HDeFIM™ can be saved and played back to optimize integration parameters after the experiment is over. Voltage, pressure, detection rate and MCP condition are monitored and recorded, and run conditions are automatically stored in the run database.

Part number: 22967 (4000), 24974 (5000)
Lead time: (ARO): 12 weeks
 
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Productivity Enhancement Package
Local electrode pump down time can be reduced to as little as four hours using the integrated heating system in the load lock.The special carousel can be heated up to 150C. The heater, hardware, and software update enable use of a fourth carousel in a LEAP system. The two features allow more flexible specimen staging, especially in a high-throughput, multi-user environment. Only available for instruments already equipped with the plasma treatment system, part number 26438.

Part number: 23772 (4000), 24965 (5000)
Lead time (ARO): 12 weeks
 
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Active Vibration Isolation Platform for LEAP
Designed and offered to allow the LEAP to be installed in environments not meeting ISO TC-D vibration standards, this integrated solution combines active vibration cancellation together with an upgraded LEAP platform.
Patented Piezoelectric technology and tuned inertial damping cancels floor vibration in real time with active bandwidth starting at 0.6Hz, 50-70% isolation achieved at 1Hz and 90% at 2-2.5Hz. Rigging and installation of vibration platform and loading of LEAP instrument onto the platform are not included in this offer, and are the responsibility of the customer. Destination room/floor must meet manufacturer requirements for anti-vibration platform.

Part number: 24315 (4000), 24972 (5000). For field upgrades, please contact your salesperson.
Lead time (ARO): 12 weeks
 
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