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Technology of APT: Advanced Specimen Preparation - How and Why

Wednesday, March 31, 2021

Technology of APT: Advanced Specimen Preparation - How and Why

Nanolyze with the best of them!

Specimen preparation for 3D nanoscale analysis with Atom Probe Tomography has become routine for a wide variety of applications, but site-specific specimen preparation to get 3D compositional information about interfaces or specific features in functional materials (like nano-electronics) can require advanced techniques, including correlative microscopy.

This webinar will discuss the tips and tricks to approach and succeed in these types of analyses, and will get you familiar with:
• backside
• parallel
• tEBSD
• TEM
• nanowire
• particle
• correlative analysis.

If you're atom probing, you'll need to watch this webinar!

Register here.