Technology of APT: Advanced Specimen Preparation - How and Why
Nanolyze with the best of them!
Specimen preparation for 3D nanoscale analysis with Atom Probe Tomography has become routine for a wide variety of applications, but site-specific specimen preparation to get 3D compositional information about interfaces or specific features in functional materials (like nano-electronics) can require advanced techniques, including correlative microscopy.
This webinar will discuss the tips and tricks to approach and succeed in these types of analyses, and will get you familiar with:
• backside
• parallel
• tEBSD
• TEM
• nanowire
• particle
• correlative analysis.
If you're atom probing, you'll need to watch this webinar!
Register here.