Skip to content

CAMECA INTRODUCES Invizo 6000 AND LEAP 6000 XR ATOM PROBES

Monday, December 6, 2021

CAMECA INTRODUCES InvizoTM6000 AND LEAP 6000 XRTM ATOM PROBES

 

-- Newest Generation of Atom Probe Tomography Instruments Build on History of Success --

MADISON WISCONSIN December2021

Following the introduction of the Local Electrode Atom Probe (LEAP) in 2003, Atom Probe Tomography (APT) has become a standard material science method enabling 3D nanoscale compositional characterization of metals and alloys, ceramics, semiconductors, biomaterials and geological materials.  CAMECA, a business unit of AMETEK, Inc.proudly announces the introduction of two new atom probe tomography platforms, the Invizo 6000 and the LEAP 6000 XRDeveloped at the Atom Probe Technology Center in Madison, Wisconsin, these new instruments continue to advancCAMECA’position as the world leader in atom probe tomography.

“Since developing the revolutionary Local Electrode Atom Probe, CAMECA has remained at the forefront of APT instrument design. Major new features of the Invizo 6000 and LEAP 6000 XR atom probes promise to further advance this research technique in both academic laboratories and manufacturing facilities worldwide.”

  

The newest addition to the instrument line, the Invizo 6000incorporatesbreakthrough technology, including  patented electrostatics that enables increased field of viewa deep ultraviolet (DUV) laser moduleadvanced beam delivery optics enabling dual-side specimen laser illumination; and a new extraction electrode design.  The Invizo 6000 provides increased analysis volumes to capture larger features-of-interest and improveanalytical measurements for a diverse set of applications such as metallurgy, geoscience, batteries, and semiconductors.

The latest instrument in the LEAP line of atom probes, the LEAP 6000 XR, builds on the proven utility of the LEAP platform and delivers analytical accuracy and precision while maintaining the microtip compatibility and automation required to support a high sample volume environment.  Specimen throughput and ease-of-use are enhanced by automation of laser-specimen-electrode alignment, and the 6000 XR adds DUV laser pulsing to deliver improvements in both data quality and specimen yieldFurthermore, it introduces novel simultaneous voltage-laser pulsing mode to increase detection sensitivity by an order of magnitude to enhance applications in semiconductors.

The launch event is available on demand!

Topic: Invizo 6000 and LEAP 6000 XR Launch Event
Start Time: Dec 9, 2021 08:30 AM

Meeting Recording:
https://zoom.us/rec/share/O2UhPTUMMY5JhJl4i7RCjZW9QpSPcgqd67kjY4zUy4UzKxu7aMIoPJ1KTfOsvTUi.L8vm30PbEYDN52q3

Access Passcode: 72kuih@i