Simultaneous voltage and laser pulsing (VpL) in atom probe tomography has been shown to improve spectral quality, improve detection sensitivity and improve specimen yield. This webinar will discuss the enabling technologies, discuss the optimization process for maximizing experimental success and give examples of applications that benefit from this new feature of the LEAP 6000
Available on demand here.
About the presenter:
Robert Ulfig
Senior Product Manager - Atom Probe Tomography
Robert M. Ulfig joined Imago (Now CAMECA Instruments Inc.) in 2001 and initially led the development of the manufacturing process for the Local Electrode Atom Probe (LEAP®) systems and since has worked as the Applications Lab Manager, Technical Sales Engineer, and now works as CAMECA’s EIKOS Product Manager and Applications Engineer. Robert works with the world-wide customer training program and integrates the activities and requests from internal and external customers into the latest and greatest of CAMECA’s software and hardware development. Robert previously worked as a Sr. Process Engineer at Advanced Micro Devices sub-micron development center in Sunnyvale CA, and graduated from The University of Wisconsin-Madison with a Masters in Materials Science and Engineering where his project involved the design, construction, and testing of a plasma source ion implantation system. He received his Bachelor’s Degree in Nuclear Engineering and Engineering Physics, also from UW-Madison, where he was a Reactor Operator at the department’s 1MWt nuclear reactor.