APT TradeShow

    • Sunday, June 10, 2018  - 
    • Friday, June 15, 2018
    APT&M 2018 Meeting
    The next Atom Probe Tomography and Microscopy Symposium (APT&M 2018) run by The International Field Emission Society (IFES) will be held at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. Gaithersburg is a fitting location since it was at NIST, just over 50 years ago, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope (14th Field Emission Symposium, 1967).

    Find more information on the IFES News & Events website page.
    Magnetic Island, Australia APT&M 2018 Meeting