APT TradeShow

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    • Tuesday, June 5, 2018  - 
    • Wednesday, June 6, 2018
    Advanced Materials Characterization Workshop 2018

    The Frederick Seitz Materials Research Laboratory
    University of Illinois at Urbana-Champaign

    The workshop provides an overview and critical comparison of major analytical techniques for materials characterization with emphasis on practical applications on various fields of Engineering, Physics, Chemistry, etc. Presentations and instrument demonstrations will span from basic to advanced topics suitable to both novice and experienced scientists. Several walkthrough examples will focus on problem-solving strategies, instrumental resolution requirements and potential artifacts on data collection and interpretation.

    Some of the topics include:

    • Atomic force microscopy (AFM) and nanoindentation.
    • Focused ion beam (FIB) for sample preparation and nanofabrication.
    • Scanning and electron microscopy (SEM, TEM, STEM) including energy dispersive x-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS).
    • Ellipsometry, FTIR, Raman, photoluminescence, confocal microscopy and spectroscopy in general.
    • X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES).
    • Secondary ion mass spectroscopy (SIMS) and Rutherford backscattering spectroscopy (RBS).
    • X-ray diffraction (XRD), reflectivity (XRR), fluorescence (XRF) and small-angle x-ray scattering (SAXS).
    • Differential scanning calorimetry (DSC), differential thermal analysis (DTA), particle size analysis, thermogravimetric analysis (TGA).
    • Special session on polymers and soft materials, including microscopy of biological specimens.

    More information here.
    United States APT&M 2018 Meeting
    • Sunday, June 10, 2018  - 
    • Friday, June 15, 2018
    APT&M 2018 Meeting
    The next Atom Probe Tomography and Microscopy Symposium (APT&M 2018) run by The International Field Emission Society (IFES) will be held at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. Gaithersburg is a fitting location since it was at NIST, just over 50 years ago, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope (14th Field Emission Symposium, 1967).

    Find more information on the IFES News & Events website page.
    United States APT&M 2018 Meeting
    • Tuesday, June 19, 2018  - 
    • Friday, June 22, 2018
    29th Annual Symposium of the Pacific Northwest Chapter of the American Vacuum Society 

    AVS Pacific Northwest Chapter
    Pacific Northwest National Laboratory (PNNL), Richland, WA

    SIMS USA 2018 (June 19)

    SIMS USA 2018 will be a one-day meeting focused on all aspects of secondary ion mass spectrometry (SIMS). The day will start with several tutorials, followed by invited and contributed talks on fundamental aspects of analysis and applications using SIMS.

    SA/PNWAVS Sessions (June 20 - 22)

    Contributions from all areas of surface and vacuum science are encouraged. Highlighted topics will include:
    Environmental Science and Applications
    • Environmental interfaces and ambient surfaces
    • In-operando studies
    Surface Science and Catalysis
    • Surface structures and reconstructions
    • Interface chemistry
    • Surface adsorption and reaction
    • Catalytic processes
    Advanced Materials Synthesis and Properties
    • Electronic, magnetic, and optical properties
    • Epitaxial superlattices and interfaces
    • Organic films and self-assembled monolayers
    • Nanomaterials preparation and properties
    • Advanced thin film characterization techniques
    Biomaterials and Biological Systems
    • Innovative surface analysis methods in bio-interfacial systems
    • Protein-surface, cell-surface and microbial-surface interactions
    • Biosensor, bioassay and biotechnology interfaces
    • Biology at the nanoscale and imaging modalities
    • Colloidal, particle and biomembrane systems
    More information can be found here.
    United States APT&M 2018 Meeting
    • Sunday, August 5, 2018  - 
    • Thursday, August 9, 2018
    Microscopy and MicroAnalysis 2018
    Baltimore, Maryland
    August 5 - 9 2018

    M&M 2018 features a vendor exposition with hundreds of exhibitor booths featuring on-site instrument demonstrations for all aspects related to microscopy and microanalysis, including sample preparation, analysis equipment, software, etc.  On-site training, and tutorials by vendors on equipment are available to all conference attendees throughout the duration of the meeting.  Additionally, the M&M scientific program features a Vendor Symposium. This forum lets vendors highlight advances in the development and improvement of their products. It covers new methods and technologies that advance the fields of microscopy and microanalysis for both physical and biological sciences, and provides a forum for exchange of ideas and best practices with conference attendees.
    More information on M&M 2018 can be found here.
    Visit CAMECA in booth #524.

    Watch this space for further information on CAMECA presentations at M&M 2018.

    United States APT&M 2018 Meeting
    • Sunday, September 9, 2018  - 
    • Friday, September 14, 2018
    IMC19 represents a forum for sharing and contesting the latest ideas and technologies in the world of microscopy.

    The 2018 program will be truly transformational, featuring the world’s thought leaders and rising stars. The scientific program will include world-renowned plenary and invited speakers, young scientists showcasing their research, digital posters and Pre-Congress workshops.

    The program will encompass four main streams: 



    Pre-Congress Workshops are now confirmed and we have an exciting array of offsite workshops encompassing the areas of:

    • Electron microscopy
    • Correlative microscopy
    • Optical microscopy
    • Atom probe microscopy
    • Sample preparation 
    • Data visualisation and analysis

    Visit http://www.imc19.com/workshops for further information and register today!
    APT&M 2018 Meeting