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  • Advanced Materials Characterization Workshop 2018

    05 June 2018 -  06 June 2018, 

    The Frederick Seitz Materials Research Laboratory
    University of Illinois at Urbana-Champaign

    The workshop provides an overview and critical comparison of major analytical techniques for materials characterization with emphasis on practical applications on various fields of Engineering, Physics, Chemistry, etc. Presentations and instrument demonstrations will span from basic to advanced topics suitable to both novice and experienced scientists. Several walkthrough examples will focus on problem-solving strategies, instrumental resolution requirements and potential artifacts on data collection and interpretation.

    Some of the topics include:

    • Atomic force microscopy (AFM) and nanoindentation.
    • Focused ion beam (FIB) for sample preparation and nanofabrication.
    • Scanning and electron microscopy (SEM, TEM, STEM) including energy dispersive x-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS).
    • Ellipsometry, FTIR, Raman, photoluminescence, confocal microscopy and spectroscopy in general.
    • X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES).
    • Secondary ion mass spectroscopy (SIMS) and Rutherford backscattering spectroscopy (RBS).
    • X-ray diffraction (XRD), reflectivity (XRR), fluorescence (XRF) and small-angle x-ray scattering (SAXS).
    • Differential scanning calorimetry (DSC), differential thermal analysis (DTA), particle size analysis, thermogravimetric analysis (TGA).
    • Special session on polymers and soft materials, including microscopy of biological specimens.

    More information here.

  • APT&M 2018 Meeting

    10 June 2018 -  15 June 2018, 

    The next Atom Probe Tomography and Microscopy Symposium (APT&M 2018) run by The International Field Emission Society (IFES) will be held at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. Gaithersburg is a fitting location since it was at NIST, just over 50 years ago, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope (14th Field Emission Symposium, 1967).

    Find more information on the IFES News & Events website page.

  • 29th Annual Symposium of the Pacific Northwest Chapter of the American Vacuum Society 

    19 June 2018 -  22 June 2018, 

    AVS Pacific Northwest Chapter
    Pacific Northwest National Laboratory (PNNL), Richland, WA

    SIMS USA 2018 (June 19)

    SIMS USA 2018 will be a one-day meeting focused on all aspects of secondary ion mass spectrometry (SIMS). The day will start with several tutorials, followed by invited and contributed talks on fundamental aspects of analysis and applications using SIMS.

    SA/PNWAVS Sessions (June 20 - 22)

    Contributions from all areas of surface and vacuum science are encouraged. Highlighted topics will include:
    Environmental Science and Applications
    • Environmental interfaces and ambient surfaces
    • In-operando studies
    Surface Science and Catalysis
    • Surface structures and reconstructions
    • Interface chemistry
    • Surface adsorption and reaction
    • Catalytic processes
    Advanced Materials Synthesis and Properties
    • Electronic, magnetic, and optical properties
    • Epitaxial superlattices and interfaces
    • Organic films and self-assembled monolayers
    • Nanomaterials preparation and properties
    • Advanced thin film characterization techniques
    Biomaterials and Biological Systems
    • Innovative surface analysis methods in bio-interfacial systems
    • Protein-surface, cell-surface and microbial-surface interactions
    • Biosensor, bioassay and biotechnology interfaces
    • Biology at the nanoscale and imaging modalities
    • Colloidal, particle and biomembrane systems
    More information can be found here.