CAMECA's New 3D Atom Probe Microscope.
13 June 2016: CAMECA unveiled EIKOS during the APT&M Conference in Korea.
We derived our new instrument’s name from the Greek word meaning ‘image,’ and we trust that EIKOS will bring atom probe tomography within the reach of many new microscopists, researchers and engineers, allowing them to image their materials at the atomic level.
The CAMECA Atom Probe Tomography product line now comprises two families:
- the LEAP 5000 (Local Electrode Atom Probe), which provides the fastest, most sensitive 3D imaging and analysis with nanoscale resolution across the widest range of applications (metals, oxides, ceramics, advanced energy storage materials, semiconductors and electronics, bio-minerals and geochemistry),
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the newly launched EIKOS family, which offers accessibility to atom probe tomography with improved ease of use and a low cost of ownership that addresses both research and industrial applications.