APT 2019 User Conference Session Topics

The 2019 Atom Probe Tomography User's Conference will feature a wide range of dynamic, functional session topics. This year's topics will include:

Workshop Topic #1 – Wednesday, 9:00AM – 12:00PM
Topic: CAMECA Updates, including IVAS 6

CAMECA will present the latest improvements and changes to Atom Probe Tomography software and hardware.  Discussion will include the latest changes to product offerings like the EIKOS laser pulsing system and LEAP changes, the Vacuum Cryogenic Transfer Module including new options for VCTM/FIB transfer, productivity enhancements such as Chain Acquisition and automated FIB specimen preparation for the LEAP systems as well as a detailed discussion of the next generation of database/APT control/Reconstruction/Analysis software, ‘AP Suite’.  Application Development, the status of the newly renewed GPM collaboration with CAMECA as well as a question and answer period will be included.  Please bring your questions, suggestions, and politely worded complaints! 

Session Leader: Rob Ulfig

Workshop Topic #2 – Wednesday, 1:30PM – 5:00PM
Topic: Atom Probe Tomography of Environmentally Sensitive Materials

This session aims to focus on the development of specimen preparation and handling strategies that enable APT analysis of materials that are sensitive to environmental exposure. Such strategies independently reported by research groups share a common approach of using specimen shuttle devices and custom load lock chamber systems that protect specimens during transfer between tools used for specimen preparation, such as a FIB/SEM or a glove box, to the Atom Probe instrument. Such strategies can not only allow specimen handling of cryogenically prepared specimens but can be also be applied at room temperature or under an inert atmosphere to a broader range of environmentally-sensitive materials. In this session, we hope to bring together leaders in this area to share their results and lead candid discussions centered on the practical application of such technology to the fields of biology, geology, and materials science.

Session Leaders: Stephan Gerstl and Daniel Perea

Workshop Topic #3 – Thursday, 8:30 AM – 12:00 PM

Topic: Data Reconstruction and Analysis Techniques

In addition to state-of-the-art instrumentation, the development of innovative approaches and methods for data reconstruction and analysis are needed to continue to maximize the vase potential of atom probe tomography. This session will focus on recent developments for the treatment of raw data to generate a tomographic reconstruction as well as methodologies to extract information regarding phase identification, clustering, or local structure. Other topics may include the use of numerical simulations to better understand the field evaporation process and data mining tools to reveal features unresolved by visual inspection in large multi-gigabyte data sets

Session Leader: Dr. Karen Henry

Workshop Topic #4 – Thursday, 1:30PM – 5:00PM

Topic: Innovative Specimen Preparation and Applications

Successful APT analysis crucially depends on suitable specimen tip preparation. Ion-beam and FIB lift-out methods today provide the most versatile approach. Between feature targeting, capping material selection and deposition, optimizing lift-out, re-orientation, mounting and tip sharpening geometries, milling and imaging constraints, controlling ion-beam implantation damage, compatibility with correlative investigations, and streamlining workflow, however, many constraints need to be taken into account for efficient, reliable, and reproducible tip preparation. This session invites contributions that present challenges that cannot be met by standard tip preparation methods, and/or examples of strategies that enable APT analysis of materials classes that traditionally have been difficult to analyze by APT.

Session Leader: Dieter Isheim

Workshop Topic #5 – Friday, 8:30AM – 12PM
Topic: APT Parameter Spaces and Best Practices

Atom Probe Tomography (APT) as a field has a growing audience of non-specialists who are less familiar with the intricacies of specimen preparation, data collection, data reconstruction, and measurement interpretation. Standards for characterization instruments exist to provide a certain “baseline of trust,” which the ATP community is work towards on various fronts, including standardize terminology, best practices for reconstruction, and requirements for publication of data. At present, significant variations exist in both hardware and sample handling (including preparation and data collection) and software/data reporting (including reconstruction and interpretation). These factors (often explored in round-robin type studies, but also in system-specific characterization studies) heavily depend on the parameter spaces we navigate to achieve best ionization conditions, ideally resulting in atom maps that accurately represent the material of study. Both of these aspects – parameter spaces and best practices – are welcome topics in this session.

Session Leaders: Austin Akey and Stephan Gerstl