APT&M 2018 Call For Papers

Tuesday, October 24, 2017

Call for Papers!

Atom Probe Tomography and Microscopy (APT&M) 2018
56th Meeting of the International Field Emission Society (IFES)
&
E.W. Müller Young Scientist Award Competition


June 10 - June 15, 2018
National Institute of Standards and Technology (NIST)
Gaithersburg, MD, U.S.A.

The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, semiconductors, ceramics, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! Ph.D. students, or recent graduates, are encouraged to submit an application package to the E.W. Müller Young Scientist Award Competition. As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.

Abstract Submission Deadline: January 15, 2018
Abstracts should not exceed 1 page in length, including figures (see template). Email abstracts to aptm2018@nist.gov.
Abstract Notification Deadline: February 28, 2018.

Müller Application Deadline: January 15, 2018
This deadline cannot be extended.

Registration Opens: January 2018
- Register!

Because NIST is a controlled-access facility, you must pre-register to attend

Travel Info

Lodging Info

Please check our website for additional information about the meeting.  The full meeting registration includes breakfast and lunch, Monday-Thursday.

We look forward to seeing you at APT&M 2018!